Scanning Electron Microscopy (SEM) with Energy Dispersive X-Ray Analysis (EDX)

SEM provides detailed high resolution images of the sample by rastering a focussed electron beam across the surface and detecting secondary or backscattered electron signal. An Energy Dispersive X-Ray Analyser (EDX or EDA) is also used to provide elemental identification and quantitative compositional information.

SEM provides images with magnifications up to ~X50,000 allowing sub micron-scale features to be seen i.e. well beyond the range of optical microscopes.

• Rapid, high resolution imaging with identification of elements present
• Spatially resolved quantitative EDX (EDA) analysis of user defined areas on sample surface
• Characterization of particulates and defects
• Examination of grain structure and segregation effects
• Coating thickness measurement using cross sectional imaging of polished sections.

Typical Applications

• Characterisation of material structures
• Assessment of reaction interfaces, service environment and degradation mechanisms
• Characterization of surface defects, stains and residues on metals, glasses, ceramics and polymers
• Measurement of the thickness of layered structures, metallised layers, oxide films, composite materials using cross sectional imaging
• Particulate and contaminant analysis on and within materials.

Typical Industries using SEM/EDX

• Aerospace
• Automotive
• Materials
• Minerals
• Glass, Ceramics and Refractories
• Healthcare
• Medical Devices
• Semiconductors
• Electronics.