Scanning Electron Microscopy (SEM) with Energy Dispersive X-Ray Analysis (EDX or EDA)
SEM provides detailed high resolution images of the sample by rastering a focussed electron beam across the surface and detecting secondary or backscattered electron signal. An Energy Dispersive X-Ray Analyser (EDX or EDA) is also used to provide elemental identification and quantitative compositional information.
SEM provides images with magnifications up to ~X50,000 allowing sub micron-scale features to be seen i.e. well beyond the range of optical microscopes.
- Rapid, high resolution imaging with identification of elements present
- Spatially resolved quantitative EDX (EDA) analysis of user defined areas on sample surface
- Characterisation of particulates and defects
- Examination of grain structure and segregation effects
- Coating thickness measurement using cross sectional imaging of polished sections.
Typical Applications
- Characterisation of material structures
- Assessment of reaction interfaces, service environment and degradation mechanisms
- Characterisation of surface defects, stains and residues on metals, glasses, ceramics and polymers
- Measurement of the thickness of layered structures, metallised layers, oxide films, composite materials using cross sectional imaging
- Particulate and contaminant analysis on and within materials.
Typical Industries using SEM / EDX
- Aerospace
- Automotive
- Materials
- Minerals
- Glass, ceramics and refractories
- Healthcare
- Medical Device
- Semiconductors
- Electronics.
