Surface Analysis

Surface and Interface Analysis

Elemental and molecular chemistry in these regions at ppm levels.

Multi-Element Depth Profiling

At depths of nm to tens of µm.

Elemental and Molecular Imaging

Maps the entire surface across a surface or cross section.

Surface Topography

Generates 3D maps on nm scale showing microstructure, wear, etc.

Materials Characterisation

Any material including drugs.

Our experts are actively involved in a number of research programmes and EU projects, as well as one-off analyses, which include:

• Troubleshooting problems
• Defending product claims
• Settling commercial liability disputes
• Reverse Engineering of competitor products
• Validating new products and processes.

Techniques

Using state-of-the-art equipment, we have a wide-range of techniques available.

• Secondary Ion Mass Spectrometry (SIMS)
• Rutherford Backscattering (RBS)
• X-ray Photoelectron Spectroscopy (XPS)
• Fourier Transform Infra-Red Spectroscopy (FT-IR)
• Scanning Electron Microscopy (SEM) & Energy Dispersive Analysis (EDA)
• X-Ray Diffraction (XRD) - X-Ray Reflectrometry (XRR), Grazing Incidence X-Ray Diffraction (GID) & Micro Diffraction (µ-XRD)
• Glow Discharge Mass Spectrometry (GDMS) & Interstitial Gas Analysis (IGA)
• 3D Non Contact Surface Profiling (3DP)
• Vapour Phase Decomposition (VPD)
• Transmission Electron Microscopy (TEM) & Electron Energy Loss Spectroscopy (EELS)
• Further Bulk Techniques