Surface Analysis

At Lucideon, we specialise in surface, near surface and interface analysis.

Surface and Interface Analysis

Elemental and molecular chemistry in these regions at ppm levels.

Multi-Element Depth Profiling

At depths of nm to tens of µm.

Elemental and Molecular Imaging

Maps the entire surface across a surface or cross section.

Surface Topography

Generates 3D maps on nm scale showing microstructure, wear, etc.

Materials Characterisation

Any material including drugs.

Our experts are actively involved in a number of research programmes and EU projects, as well as one-off analyses, which include:

  • Troubleshooting problems
  • Defending product claims
  • Settling commercial liability disputes
  • Reverse Engineering of competitor products
  • Validating new products and processes.


Using state-of-the-art equipment, we have a wide-range of techniques available.

  • Secondary Ion Mass Spectrometry (SIMS)
  • Rutherford Backscattering (RBS)
  • X-ray Photoelectron Spectroscopy (XPS)
  • Fourier Transform Infra-Red Spectroscopy (FT-IR)
  • Scanning Electron Microscopy (SEM) & Energy Dispersive Analysis (EDA)
  • X-Ray Diffraction (XRD) - X-Ray Reflectrometry (XRR), Grazing Incidence X-Ray Diffraction (GID) & Micro Diffraction (µ-XRD)
  • Glow Discharge Mass Spectrometry (GDMS) & Interstitial Gas Analysis (IGA)
  • 3D Non Contact Surface Profiling (3DP)
  • Vapour Phase Decomposition (VPD)
  • Transmission Electron Microscopy (TEM) & Electron Energy Loss Spectroscopy (EELS)
  • Further Bulk Techniques.


  • White paper

    Surface Analysis ... Solving Problems in the PCB Industry

    pdf 1 MB

  • White paper

    Surface Analysis Exposes Counterfeit Medicines

    pdf 479 KB

  • White paper

    Surface Characterisation in the Semiconductor Industry

    pdf 3 MB

  • White paper

    How Surface Characterisation is Helping the Aerospace Industry to Achieve Environmental Targets

    pdf 723 KB

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