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[October 2004]
New VPSEM Claimed to Give Outstanding Performance
Hitachi High-Technologies Corporation (Finchampstead, Wokingham, Berks, England) has announced the launch of the S-3400N variable pressure scanning electron microscope (VPSEM). With new electron optics, detector, pumping system and enhanced sample handling and analysis capabilities, this new instrument is said to allow better quality images to be produced from even the most difficult specimens quickly and more easily.
A major innovation in the S-3400N is the electron optical system which features a new gun bias arrangement and fully automatic beam alignment. The new quadrant bias system delivers greater beam current, particularly at low accelerating voltages. This in turn leads to better resolution at low accelerating voltages (10nm at 3kV). The auto beam alignment system ensures that the beam is perfectly aligned and even includes automatic aperture alignment. Perfect alignment gives the sharpest images under all operating conditions.
The S-3400N features a turbomolecular pumping system which brings a number of benefits. With no cooling water required, the instrument is both energy efficient and aids the environment by avoiding water wastage. Equally importantly, the turbomolecular pump produces a cleaner vacuum and brings fast pump-down time and a 90-second specimen exchange, ensuring fast sample throughput. The variable pressure range is 6Pa to 270Pa, allowing oily, wet or non-conducting samples to be imaged.
www.hitachi-hitec-uk.com
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