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[May 2001]
New Control Software for Scanning Electron Microscopes
A new WindowsTM based graphical user interface (GUI) has been announced for Hitachi Scientific Instruments' S-3000H and S-3500H conventional scanning electron microscopes (SEMs) and the S-3000N and S-3500N variable pressure SEMs. This new control system offers improved display, set-up, report generation and maintenance facilities.
System operation and image display have been improved with the introduction of adjustable size buttons on the tool bar and a choice of display formats for the SEM image up to full monitor size. For added versatility, a scrollable display of thumbnails of up to 16 captured images can be displayed alongside the main image window.
To further aid easy operation, images can be captured together with a comprehensive range of instrument operating conditions, which can subsequently be readily recalled. Operational parameters stored include magnification, accelerating voltage, gun bias voltage and, for VPSEM versions, vacuum mode and conditions. If the instrument is equipped with a 5-axis motorised stage, then recalling the stored parameters automatically sets the appropriate working distance. In addition, if a suitable vacuum is present, the beam is automatically switched on and automatic focus, brightness and contrast initiated to provide a focused image.
Web site: http://www.his-europe.com
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