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[May 2003]
Fraunhofer IPA Buys Advanced Computed Tomography System
X-Tek Systems Ltd (Tring , Herts, England) has announced the sale of one its
latest HMX ST 225 X-ray inspection systems with advanced 3D computed
tomography (CT) capabilities to the Fraunhofer Institute of Manufacturing
Engineering and Automation in Stuttgart, Germany.Fraunhofer IPA serves the test and inspection needs of a number of diverse
industries. The purchase of this real-time microfocus X-ray inspection
system - along with X-Tek's proprietary Computed Tomography software - will
allow it to successfully test and generate complex 3D images of microscopic
electronic components as well as complete assemblies, PCBs and even complete
devices such as mobile phones.It will also be used to non-destructively test a wide range of high density
metals and low density plastics, ceramics, glass-fibre and other composites.Explaining the decision to choose the X-Tek machine, Nico Blessing, Project
Manager, Information Processing at Fraunhofer IPA said: "X-Tek's major
strength lies in the smooth integration between software and hardware that
its systems provide. This enables us to integrate our own software modules
into the HMX ST system and access and manipulate CT data sets very quickly
and easily".Further factors in the choice of the HMX ST were its powerful 225kV X-ray
source and extremely fine microfocal X-ray spot size of just 5 microns,
which together will allow Fraunhofer IPA to gain exceptional image
resolution and system magnification up to 400 times.
ENDS