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[June 2001]
International Conference on X-ray Analysis
Philips Analytical (Cambridge, England) has announced the 22nd International Durham Conference on X-ray Analysis, which will take place at the University of Durham from 10-13 September 2001.
To give maximum choice and variety to delegates, a comprehensive technical programme of both X-ray diffraction and X-ray spectrometry has been organised which includes several training opportunities for learning new skills or refreshing old ones. One dedicated sessions will also investigate the issues around the quality of the analytical result.
Invitations to present the plenary lectures have been kindly accepted by John Faber of the International Centre for Diffraction Data and John Sieber of the National Institute of Standards and Technology, both of the USA.
For further information, e-mail Sally Fuller:
sally.fuller@philips.com
ENDS