 |
 |
||||||
[June 2003]
Characterization of Materials - New Two-Volume Set
John Wiley & Sons Ltd (Chichester, West Sussex, England) has announced the publication of 'Characterization of Materials', a two-volume set edited by Elton Kaufmann, Associate Director of the Strategic Planning Group at the Argonne National Laboratory, Argonne, IL, USA. He is concurrently a physicist with the Materials Science Division at Argonne.
The publication provides up-to-date, comprehensive coverage of characterization techniques, including computational and theoretical methods, crystallography, mechanical testing, optical imaging and spectroscopy.
Written by expert authors, the work is designed to provide not only a fundamental understanding of each technique, but to assist researchers in choosing the most appropriate method for measuring a given material and property.
Organised by technique - rather than discipline, as properties overlap in so many different fields - each article covers an individual measurement method and contains a description of the method, its limitations, relationship to competing techniques and numerous application examples.
Methods covered include general vacuum techniques; X-ray powder diffraction; high strain rate testing; deep level transient spectroscopy; cyclic voltammetry; extended X-ray absorption fine structure; low energy electron diffraction; thermogravimetric analysis; magnetometry; transmission electron microscopy; and UV photoelectron spectroscopy.
The two volumes - ISBN 0-471-26882-8 - are available at a total cost of £279.
ENDS