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[January 2005]
SEM Has Extended Capabilities
A new specimen stage has been introduced for the S-2600N variable pressure scanning electron microscope (SEM) from Hitachi High-Technologies Corp (Wokingham, Berks, England). The new stage gives increased specimen movement to 40mm in both X and Y directions, giving an increased specimen coverage of 220% compared to the previous model. The stage also benefits from Z movement from 5mm to 35mm, tilt of minus 20° to plus 90° and rotation of 360°.
The new stage will, says Hitachi, greatly enhance the range of samples that can be examined by the versatile S-2600N. This entry-level variable pressure system provides the capability to observe and capture SEM images of non-conducting and/or hydrated samples without preparation. The elimination of sample preparation not only saves time and money but also prevents artefacts from being introduced into the images.
The S-2600N is designed for both novice operators and experienced users. The microscope features an intelligent software interface which guides operators from the first step of selecting the proper operating conditions through to the final step of image acquisition. The instrument offers high vacuum resolution of 4nm and variable pressure resolution of 5nm.
Website: www.hitachi-hitec-uk.com
ENDS