Materials Characterisation
Manufacturers of semiconductor devices, components and PCBs need to know the quality of starting materials, whether it is low level (ppb) impurity levels in silicon wafers or the composition of aluminium bonding wires.
At CERAM, our experts use a variety of techniques to assess quality, helping the manufacturer to optimise both their products and processes.
The techniques of choice for these bulk chemical analyses are:
- X-Ray Fluorescence (XRF)
- Glow Discharge Mass Spectrometry (GDMS) (particularly suited to ppb level determination of impurities).
CERAM Examines Layer Growth and Doping Uniformity in Solar Photovoltaics
SIMS depth profiling
CERAM Investigates Electrical Drift in MOSFET Devices
SIMS analysis provided by CERAM
CERAM Reveals the Cause of Corrosion during the Manufacture of Semiconductor Devices
Expert analysis provided by CERAM